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Randomized benchmarking and process tomography for gate errors in a solid-state qubit

J.M. Chow ; J.M. Gambetta ; Lars Tornberg (Institutionen för mikroteknologi och nanovetenskap, Tillämpad kvantfysik) ; Jens Koch ; Lev S. Bishop ; A. A. Houck ; B. R. Johnson ; L. Frunzio ; S.M. Girvin ; R. J. Schoelkopf
Physical Review Letters (0031-9007). Vol. 102 (2009), 9,
[Artikel, refereegranskad vetenskaplig]

We present measurements of single-qubit gate errors for a superconducting qubit. Results from quantum process tomography and randomized benchmarking are compared with gate errors obtained from a double pulse experiment. Randomized benchmarking reveals a minimum average gate error of 1.1±0.3% and a simple exponential dependence of fidelity on the number of gates. It shows that the limits on gate fidelity are primarily imposed by qubit decoherence, in agreement with theory.

Article Number: 090502

Denna post skapades 2009-03-18. Senast ändrad 2013-10-29.
CPL Pubid: 91604


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Institutionen för mikroteknologi och nanovetenskap, Tillämpad kvantfysik



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