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A General Statistical Equivalent-Circuit-Based De-Embedding Procedure for High-Frequency Measurements

Mattias Ferndahl (Institutionen för mikroteknologi och nanovetenskap, Mikrovågselektronik) ; Christian Fager (Institutionen för mikroteknologi och nanovetenskap, Mikrovågselektronik) ; Kristoffer Andersson (Institutionen för mikroteknologi och nanovetenskap, Mikrovågselektronik) ; Peter Linnér (Institutionen för mikroteknologi och nanovetenskap, Mikrovågselektronik) ; Hans-Olof Vickes (Extern ; Institutionen för mikroteknologi och nanovetenskap, Mikrovågselektronik) ; Herbert Zirath (Institutionen för mikroteknologi och nanovetenskap, Mikrovågselektronik)
IEEE Transactions on Microwave Theory and Techniques (0018-9480). Vol. 56 (2008), 12, p. 2692-2700.
[Artikel, refereegranskad vetenskaplig]

A general equivalent-circuit-based method for the de-embedding of scattering parameters is presented. An equivalent circuit representation is used to model the embedding package. The parameters in the models are estimated with a statistical method using measured data from all de-embedding standards jointly together. Hence, it is possible to assess parameter estimates and their variance and covariance due to measurement uncertainties. A general de-embedding equation, which is valid for any five-port with a defined nodal admittance matrix, is derived and used in the subsequent de-embedding of measured device data. Different equivalent circuit models for the embedding network are then studied, and tradeoffs between model complexity and uncertainty are evaluated. Furthermore, the influence of varying number and combinations of de-embedding standards on the parameter estimates is investigated. The method is verified, using both measured and synthetic data, and compared against previously published work. It is found to be more general while keeping or improving accuracy.

Nyckelord: CMOS, de-embedding, high-frequency measurement, maximum-likelihood estimation, scattering parameters, semiconductor device modeling



Denna post skapades 2009-01-08. Senast ändrad 2017-03-21.
CPL Pubid: 84087

 

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