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Individual grain orientations and texture development of nanocrystalline electrodeposits showing abnormal grain growth

Uta Klement (Institutionen för material- och tillverkningsteknik, Yt- och mikrostrukturteknik) ; Melina da Silva (Institutionen för material- och tillverkningsteknik, Yt- och mikrostrukturteknik)
Jounal of Alloys and Compounds Vol. 434-435 (2007), p. 714-717.
[Artikel, refereegranskad vetenskaplig]

The electron backscatter diffraction (EBSD) technique has been used to determine grain orientations of abnormally growngrains in nanocrystalline Ni electrodeposits upon annealing. The results show that the first grown grains have a <3 1 1>//ND orientation. Upon annealing further grain growth occurs and the preferred alignment of the abnormally growing grains changes from <3 1 1>//ND to <1 1 1>//ND. The subgrain coalescence model adopted from recrystallization is used to describe the occurrence of abnormal grain growth, and energy considerations are put forward for explaining the dominance of the <1 1 1>//ND texture component after longer annealing treatments.

Nyckelord: Metals; Nanostructures; Crystal growth; Scanning and transmission electron microscopy; X-ray diffraction

Denna post skapades 2007-04-17. Senast ändrad 2014-09-02.
CPL Pubid: 40575


Institutioner (Chalmers)

Institutionen för material- och tillverkningsteknik, Yt- och mikrostrukturteknik



Chalmers infrastruktur