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Characterization Accuracy of High-Q Reactors Using Broadband Reflection/Transmission Measurement Techniques

Anatoli Deleniv (Institutionen för mikroteknologi och nanovetenskap, Mikrovågs- och terahertzteknologi) ; Spartak Gevorgian (Institutionen för mikroteknologi och nanovetenskap, Mikrovågs- och terahertzteknologi)
Proceedings of EUMC 2006, 10-15 Sept. 2006, Manchester, UK p. 975-979. (2006)
[Konferensbidrag, refereegranskat]

Characterization accuracy of high-Q reactors due to measurement uncertainties is analyzed in this paper. Two broadband techniques based on reflection and transmission type measurements are considered. A differential calculus combined with an equivalent circuit representation of the measurement error are used here to derive simple analytic formulas. It is shown that the accuracy of calibrated VNA is insufficient to obtain accurate loss data. A measurement procedure is proposed that improves the accuracy of loss measurement. A measurement example is given demonstrating the utility of the above approach.

Nyckelord: high-Q reactors, measurement uncertainties



Denna post skapades 2007-03-08.
CPL Pubid: 25760

 

Institutioner (Chalmers)

Institutionen för mikroteknologi och nanovetenskap, Mikrovågs- och terahertzteknologi (2006-2007)

Ämnesområden

NATURVETENSKAP

Chalmers infrastruktur