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Room temperature plasticity in thermally grown sub-micron oxide scales revealed by micro-cantilever bending

Anand H S Iyer (Institutionen för fysik, Materialens mikrostruktur (Chalmers)) ; Krystyna Stiller (Institutionen för fysik, Materialens mikrostruktur (Chalmers)) ; Magnus Hörnqvist Colliander (Institutionen för fysik, Materialens mikrostruktur (Chalmers))
Scripta Materialia (1359-6462). Vol. 144 (2018), p. 9-12.
[Artikel, refereegranskad vetenskaplig]

We propose a new geometry for focused ion beam milled micro-cantilevers, which allows production of residual stress-free, isolated thin film specimens from film-substrate systems. This geometry was used to demonstrate the presence of permanent deformation in about 200 nm thick thermally grown oxide scales on a Ni-base superalloy, after applying large bending displacements in-situ in a scanning electron microscope. Stiffness measurements performed before and after the bending tests confirmed the absence of micro-cracks, leading to the conclusion that plastic deformation occurred in the oxide scale. The proposed method is extendable to other film-substrate systems and testing conditions, like non-ambient temperatures.

Nyckelord: Focused ion beam (FIB); Scanning electron microscopy (SEM); Crystalline oxides; Plastic deformation; Micro-mechanical testing



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Denna post skapades 2017-10-17. Senast ändrad 2017-11-24.
CPL Pubid: 252587

 

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