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An efficient parameter extraction algorithm for MOS transistor models

Peter R. Karlsson (Institutionen för fasta tillståndets elektronik) ; Kjell Jeppson (Institutionen för fasta tillståndets elektronik ; Institutionen för mikroelektronik och nanovetenskap)
IEEE Transactions on Electron Devices (0018-9383). Vol. 39 (1992), 9, p. 2070 - 2076.
[Artikel, refereegranskad vetenskaplig]

A general, direct parameter extraction algorithm that uses a small number of data points has been developed for MOS transistor models. This extraction algorithm has been tested using two transistor models in SPICE, MOS3, and BSIM. The basic idea of the algorithm is to use only one data point for each transistor parameter. Appropriate selection of the data points ensures physically reasonable values of most extracted parameters. Analytical expressions or rapidly converging numerical equations are used to calculate the parameters. Interaction between different parameters are taken into account. Good agreement between measured and simulated data is obtained from only 15 and 25 data points for MOS3 and BSIM, respectively. The total extraction time for a single transistor is around 40 s for MOS3 and 1 min for BSIM.

Nyckelord: Parameter extraction, MOSFETs, Data mining, SPICE, Equations, Semiconductor device modeling, Production control, Integrated circuit modeling, Threshold voltage, Circuit simulation



Denna post skapades 2017-01-28.
CPL Pubid: 247812

 

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Institutioner (Chalmers)

Institutionen för fasta tillståndets elektronik (1985-1998)
Institutionen för mikroelektronik och nanovetenskap (1900-2003)

Ämnesområden

Elektroteknik och elektronik

Chalmers infrastruktur