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Power monitoring, Fourier transforms of power, and electron microscopy in evaluating the performance of abrasives in grinding

J. A. Badger ; R. Drazumeric ; Peter Krajnik (Institutionen för material- och tillverkningsteknik, Tillverkningsteknik)
International Journal of Abrasive Technology (1752-2641). Vol. 7 (2016), 4, p. 270-283.
[Artikel, refereegranskad vetenskaplig]

The use of electron microscopy and power-monitoring during grinding was investigated in terms of evaluating the fracture and wear characteristics and chip-formation mechanisms of abrasive grains and bond formulations. Diamond abrasives and fused, sintered and sintered triangular-shaped aluminium-oxide abrasives were evaluated. Power was shown to be a useful tool in determining the chip-formation mechanisms and the extent of grit fracture, particularly in triangular-shaped abrasive. Conclusions were supported by electron-microscope analysis. Power was also used to evaluate low-cost diamond vs. premium diamond abrasives. Practical recommendations are given for evaluating grit, wheel and bond performance both in the laboratory and in production.

Nyckelord: Abrasives, Chip-formation, Electron microscopy, Engineered-shape abrasive, Fracture, Sintered abrasive

Denna post skapades 2017-01-25. Senast ändrad 2017-01-30.
CPL Pubid: 247700


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Institutioner (Chalmers)

Institutionen för material- och tillverkningsteknik, Tillverkningsteknik (2005-2017)



Chalmers infrastruktur