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3D laser scanning confocal microscopy of siloxane-based comb and double-comb polymers in PVDF-HFP thin films

E. Cznotka ; Steffen Jeschke (Institutionen för fysik (Chalmers)) ; S. Schmohl ; Patrik Johansson (Institutionen för fysik, Kondenserade materiens fysik (Chalmers)) ; H. D. Wiemhofer
Journal of Coatings Technology and Research (1945-9645). Vol. 13 (2016), 4, p. 577-587.
[Artikel, refereegranskad vetenskaplig]

Currently, atomic force microscopy is the preferred technique to determine roughness on membrane surfaces. In this paper, a new method to measure surface roughness is presented using a 3D laser scanning confocal microscope for high-resolution topographic analysis and is compared to conventional SEM. For this study, the surfaces of eight samples based on a poly(vinylidene fluoride-co-hexafluoropropylene) (PVDF-HFP) host polymer with different liquid interpenetrating components were analyzed. Polymethylhydrosiloxane, triethylene glycolallylmethyether, (3,3,3-trifluoropropyl) methylcyclotrisiloxane (D-3-C2H4CF3), polysiloxane-comb-propyloxymethoxytriglycol (PSx), poly-siloxane-comb-propyl-3,3,3-trifluoro (PSx-C2H4CF3), poly [bis(2-(2-methoxyethoxy) ethoxy) phosphazene, or poly [bis(trifluoro) ethoxy] phosphazene was chosen as interpenetrating compound to investigate the impact of comb and double-comb-structured polymer backbones, as well as their dipolar or fluorous residues on the PVDF-HFP-miscibility. Different phases of the constituting ingredients were identified via their thermal properties determined by DSC. Additionally, the COSMO-RS method supported the experimental results, and with regard to computed sigma-profiles, new modified structures for polysiloxane and polyphosphazene synthesis were suggested.

Nyckelord: 3D laser scanning confocal microscopy, Thin film, Polymer electrolyte, comb and double-comb polymers



Denna post skapades 2016-10-14.
CPL Pubid: 243399

 

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