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Relaxation of quantum dots in a magnetic field at finite bias - charge, spin and heat currents

Joren Vanherck ; Jens Schulenborg (Institutionen för mikroteknologi och nanovetenskap, Tillämpad kvantfysik) ; Roman Saptsov ; Janine Splettstoesser (Institutionen för mikroteknologi och nanovetenskap, Tillämpad kvantfysik) ; Maarten Wegewijs
Physica Status Solidi (B) (0370-1972). Vol. 254 (2016), 3,
[Artikel, refereegranskad vetenskaplig]

We perform a detailed study of the effect of finite bias and magnetic field on the tunneling-induced decay of the state of a quantum dot by applying a recently discovered general duality [PRB 93, 81411 (2016)]. This duality provides deep physical insight into the decay dynamics of electronic open quantum systems with strong Coulomb interaction. It associates the amplitudes of decay eigenmodes of the actual system to the eigenmodes of a so-called dual system with attractive interaction. Thereby, it predicts many surprising features in the transient transport and its dependence on experimental control parameters: the attractive interaction of the dual model shows up as sharp features in the amplitudes of measurable time-dependent currents through the actual repulsive system. In particular, for interacting quantum dots, the time-dependent heat current exhibits a decay mode that dissipates the interaction energy and that is tied to the fermion parity of the system. We show that its decay amplitude has an unexpected gate-voltage dependence that is robust up to sizable bias voltages and then bifurcates, reflecting that the Coulomb blockade is lifted in the dual system. Furthermore, combining our duality relation with the known Iche-duality, we derive new symmetry properties of the decay rates as a function of magnetic field and gate voltage. Finally, we quantify charge- and spin-mode mixing due to the magnetic field using a single mixing parameter.

Nyckelord: quantum dots, nonequilibrium open-system dynamics, few-electron control

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Denna post skapades 2016-09-23. Senast ändrad 2017-08-15.
CPL Pubid: 242247


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