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New method for determination of the peak-velocity in epitaxial semiconductor structures by dc measurements on microbridges

W. Strupinski ; Herbert Zirath (Institutionen för mikrovågsteknik) ; Hans Grönqvist (Institutionen för mikrovågsteknik) ; Niklas Rorsman (Institutionen för mikrovågsteknik)
Applied Physics Letters (0003-6951). Vol. 59 (1991), 24, p. 3151-3153.
[Artikel, refereegranskad vetenskaplig]

A simple current-voltage measurement technique using microbridge patterns is described as a fast method for the determination of the effective peak electron velocity in III-V semiconducting materials. The method is tested for GaAs samples. Microbridge patterns with different geometries were investigated and the influence of ''self-heating'' by power dissipation was examined. Some other potential sources of errors deteriorating the accuracy of measurements were determined.

Denna post skapades 2016-09-12. Senast ändrad 2017-03-21.
CPL Pubid: 241665


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