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Detailed Study of the Influence of InGaAs Matrix on the Strain Reduction in the InAs Dot-In-Well Structure

P. Wang ; Q. M. Chen ; X. Y. Wu ; C. F. Cao ; Shumin Wang (Institutionen för mikroteknologi och nanovetenskap, Fotonik) ; Q. Gong
Nanoscale Research Letters (1556-276X). Vol. 11 (2016), p. Article Number: 119.
[Artikel, refereegranskad vetenskaplig]

InAs/InGaAs dot-in-well (DWELL) structures have been investigated with the systematically varied InGaAs thickness. Both the strained buffer layer (SBL) below the dot layer and the strain-reducing layer (SRL) above the dot layer were found to be responsible for the redshift in photoluminescence (PL) emission of the InAs/InGaAs DWELL structure. A linear followed by a saturation behavior of the emission redshift was observed as a function of the SBL and SRL thickness, respectively. The PL intensity is greatly enhanced by applying both of the SRL and SBL. Finite element analysis simulation and transmission electron microscopy (TEM) measurement were carried out to analyze the strain distribution in the InAs QD and the InGaAs SBL. The results clearly indicate the strain reduction in the QD induced by the SBL, which are likely the main cause for the emission redshift.

Nyckelord: Quantum dots, InAs/InGaAs, Dot-in-well, InGaAs matrix, Photoluminescence, Finite element, AFM, TEM



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Denna post skapades 2016-04-06. Senast ändrad 2016-04-06.
CPL Pubid: 234210

 

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Institutioner (Chalmers)

Institutionen för mikroteknologi och nanovetenskap, Fotonik

Ämnesområden

Materialvetenskap
Materialteknik

Chalmers infrastruktur