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Sample preparation and microstructural characterization of the gamma titanium aluminide Ti-48Al-2W-0.5Si

Viktor Recina (Institutionen för metalliska konstruktionsmaterial) ; Johan Ahlström (Institutionen för metalliska konstruktionsmaterial) ; Birger Karlsson (Institutionen för metalliska konstruktionsmaterial)
Materials Characterization (1044-5803). Vol. 38 (1997), 4-5, p. 287-300.
[Artikel, refereegranskad vetenskaplig]

Preparing samples that faithfully reveal all microstructural features in γ-TiAl-base alloys for both optical and scanning electron microscope studies is fraught with difficulties. This study demonstrates that satisfactory results can be obtained through mechanical grinding, polishing, and proper etching. A preparation recipe is presented. Nine lots of investmentcast γ-TiAl material with the nominal composition of Ti-48Al-2W-0.5Si have been characterized through optical and scanning electron microscope examinations. The study shows that a small depletion in Al content has a large effect on the microstructure. The duplex microstructure with a lamellar Full-size image (<1 K) colony size of about 500μm and a large percentage of singlephase γ grains as large as 200μm is altered to a coarse, nearly lamellar microstructure with a colony size as large as 5000μm and a small percentage of small single-phase γ grains in the colony boundaries.



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CPL Pubid: 229036

 

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Institutioner (Chalmers)

Institutionen för metalliska konstruktionsmaterial (1900-2003)

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Materialvetenskap
Transport
Metallurgi och metalliska material
Konstruktionsmaterial

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