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TEM investigation on stress contrast and interfaces of contacting particles, Materials Characterization

Yiming Yao (Institutionen för experimentell fysik, Mikroskopi och mikroanalys) ; A.R. Thölén (Institutionen för experimentell fysik, Mikroskopi och mikroanalys)
MATERIALS CHARACTERIZATION Vol. 44 (2000), p. 441-452.
[Artikel, övrig populärvetenskap]

An investigation on nanoparticle contacting using convergent beam electron diffraction (CBED) and high-resolution electron microscopy (HREM) is reported. Cobalt particles (5–200nm) from a solution-treated Cu–2(w/o)Co alloy were extracted and allowed to contact without pressure. The contacting stress field due to adhesion was clearly observed, and the stress field had a dipole character. Free particles were observed to contact along low-index zone axes and with specific orientation relationships. Fourier transformation of the HREM micrographs revealed a highly distorted area along the contacting boundary containing dislocations. Electron-diffraction contrast from the stress fields between contacting particles was simulated, and agreed well with the experiments. © Elsevier Science Inc., 2000. All rights reserved.

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Denna post skapades 2015-11-06.
CPL Pubid: 225390


Institutioner (Chalmers)

Institutionen för experimentell fysik, Mikroskopi och mikroanalys (1997-2004)


Nanovetenskap och nanoteknik
Övrig teknisk materialvetenskap

Chalmers infrastruktur