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On Specific Capacitance of SIS Junctions

Parisa Yadranjee Aghdam (Institutionen för rymd- och geovetenskap, Avancerad mottagarutveckling) ; Hawal Rashid (Institutionen för rymd- och geovetenskap, Avancerad mottagarutveckling) ; Alexey Pavolotsky (Institutionen för rymd- och geovetenskap, Avancerad mottagarutveckling) ; Vincent Desmaris (Institutionen för rymd- och geovetenskap, Avancerad mottagarutveckling) ; Denis Meledin (Institutionen för rymd- och geovetenskap, Avancerad mottagarutveckling) ; Victor Belitsky (Institutionen för rymd- och geovetenskap, Avancerad mottagarutveckling)
26TH INTERNATIONAL SYMPOSIUM ON SPACE TERAHERTZ TECHNOLOGY (2015)
[Konferensbidrag, refereegranskat]

We have discussed possible reasons of scatter in the specific capacitance measurement results reported by different authors. This observed scatter of the measurement data at higher critical current densities (lower RnA values) could be due variation of the tunnel barrier thickness within the same junction realized in various laboratories. We have shown this through modelling of the tunnel barrier as discrete areas of n, n-1 and n+1 monolayers. This results in a spread of the SIS junction specific capacitance for the same current density. Also, the reported data difference could be a consequence of the high uncertainty of the measurement methods. We developed and demonstrated a measurement method proved to provide a high accuracy in characterization of SIS junction capacitance. At the conference, we will present modelling and the data for direct measurement of SIS junction specific capacitance and compare these data with the earlier reported measurements.



Denna post skapades 2015-05-06. Senast ändrad 2015-12-03.
CPL Pubid: 216697

 

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Institutioner (Chalmers)

Institutionen för rymd- och geovetenskap, Avancerad mottagarutveckling (2010-2017)

Ämnesområden

Supraledning

Chalmers infrastruktur

NFL/Myfab (Nanofabrication Laboratory)
Onsala rymdobservatorium