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Effect of enhanced current crowding in a CPW with a thin ferroelectric film

Erik F. Carlsson (Institutionen för mikrovågsteknik) ; Spartak Gevorgian (Institutionen för mikroelektronik och nanovetenskap)
Electronics Letters (0013-5194). Vol. 33 (1997), 2, p. 145-146.
[Artikel, refereegranskad vetenskaplig]

Enhanced current crowding is predicted at the edges of the conducting strips in thin ferroelectric film coplanar waveguides (CPWs). A minimum current crowding depth is expected, which depends on the CPW geometry and dielectric constant of the ferroelectric film. In practical CPW devices the enhanced current crowding can increase the conductor losses by up to four times. The current crowding depth may be smaller than the skin depth or London penetration depth (for high temperature superconducting CPW)

Nyckelord: coplanar waveguides current distribution electric fields ferroelectric thin films losses microwave devices permittivity waveguide theory

Denna post skapades 2015-02-12.
CPL Pubid: 212534


Institutioner (Chalmers)

Institutionen för mikrovågsteknik (1900-2003)
Institutionen för mikroelektronik och nanovetenskap (1900-2003)


Elektroteknik och elektronik

Chalmers infrastruktur