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X-ray study of SrTiO3 thin films in multilayer structures

Peter Petrov ; Zdravko Ivanov (Institutionen för fysik) ; Spartak Gevorgian (Institutionen för mikroelektronik och nanovetenskap)
Materials Science & Engineering: A (0921-5093). Vol. 288 (2000), 2, p. 231–234.
[Artikel, refereegranskad vetenskaplig]

A set of YBa2Cu3O7-x (YBCO)/SrTiO3 (STO) multilayer structures are investigated using conventional and grazing-incidence X-ray diffraction techniques. For all samples ω- and φ-scans are performed. From the peak position and broadening analysis of peak shape, the a, b, and c lattice parameters for STO films as well as the microstrain values along these directions are evaluated. It is observed that the crystal cell of the STO film becomes orthorhombic when a YBCO thin film is grown on top of STO. The differences between b and a parameters of STO crystal cell and the microstrain are reduced by using buffer layers.

Denna post skapades 2015-02-11.
CPL Pubid: 212390


Institutioner (Chalmers)

Institutionen för fysik (1900-2003)
Institutionen för mikroelektronik och nanovetenskap (1900-2003)


Den kondenserade materiens fysik

Chalmers infrastruktur