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Evaluation of an InAlN/AlN/GaN HEMT with Ta-based ohmic contacts and PECVD SiN passivation

Anna Malmros (Institutionen för mikroteknologi och nanovetenskap, Mikrovågselektronik) ; P. Gamarra ; Mattias Thorsell (Institutionen för mikroteknologi och nanovetenskap, Mikrovågselektronik) ; M. A. di Forte-Poisson ; C. Lacam ; M. Tordjman ; R. Aubry ; Herbert Zirath (Institutionen för mikroteknologi och nanovetenskap, Mikrovågselektronik) ; Niklas Rorsman (Institutionen för mikroteknologi och nanovetenskap, Mikrovågselektronik)
Physica Status Solidi C: Current Topics in Solid State Physics. 10th International Conference on Nitride Semiconductors (ICNS), Washington DC., AUG 25-30, 2013 (1862-6351). Vol. 11 (2014), 3-4, p. 924-927.
[Konferensbidrag, refereegranskat]

An InAlN/AlN/GaN HEMT with Au-free Ta-based ohmic contacts and a high-quality PECVD SiN passivation is reported. The ohmic contacts were annealed at 550 degrees C, resulting in a contact resistance of 0.64 Omm. The gate length was 50 nm. The device performance and the process were evaluated by performing DC-, pulsed IV-, RF-, and load-pull measurements. It was observed that current slump was effectively mitigated by the passivation layer. The DC channel current density increased by 71 % to 1170 mA/mm at the knee of the IV curve, and the transconductance increased from 382 to 477 mS/mm after passivation. At the same time the gate leakage increased, and the extrinsic f(max) decreased from 207 to 140 GHz. Output powers of 4.1 and 3.5 W/mm were measured after passivation at 31 and 40 GHz, respectively.

Nyckelord: InAlN, HEMT, ohmic contact, Ta, passivation



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Denna post skapades 2015-01-09. Senast ändrad 2015-08-10.
CPL Pubid: 210398

 

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