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A Probabilistic Analysis of Resilient Reconfigurable Designs

Alirad Malek (Institutionen för data- och informationsteknik, Datorteknik (Chalmers)) ; Stavros Tzilis (Institutionen för data- och informationsteknik, Datorteknik (Chalmers)) ; Danish Anis Khan (Institutionen för data- och informationsteknik (Chalmers)) ; Ioannis Sourdis (Institutionen för data- och informationsteknik, Datorteknik (Chalmers)) ; George Smaragdos ; Christos Strydis
27th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, Netherlands, 1-3 October 2014 (1550-5774). p. 141-146. (2014)
[Konferensbidrag, refereegranskat]

Reconfigurable hardware can be employed to tolerate permanent faults. Hardware components comprising a System-on-Chip can be partitioned into a handful of substitutable units interconnected with reconfigurable wires to allow isolation and replacement of faulty parts. This paper offers a probabilistic analysis of reconfigurable designs estimating for different fault densities the average number of fault-free components that can be constructed as well as the probability to guarantee a particular availability of components. Considering the area overheads of reconfigurability, we evaluate the resilience of various reconfigurable designs with different granularities. Based on this analysis, we conduct a comprehensive design-space exploration to identify the granularity mixes that maximize the fault-tolerance of a system. Our findings reveal that mixing fine-grain logic with a coarse-grain sparing approach tolerates up to 3x more permanent faults than component redundancy and 2x more than any other purely coarse-grain solution. Component redundancy is preferable at low fault densities, while coarse-grain and mixedgrain reconfigurability maximize availability at medium and high fault densities, respectively.

Nyckelord: Reconfigurable hardware, Fault tolerance, MPSOC, fine-grain, coarse-grain


Article number 6962074



Denna post skapades 2014-12-15. Senast ändrad 2016-09-14.
CPL Pubid: 208107

 

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Projekt

Denna publikation är ett resultat av följande projekt:


on-Demand System Reliability (DESYRE) (EC/FP7/287611)