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The EMRP project GraphOhm- Towards quantum resistance metrology based on graphene

F.J. Ahlers ; J.L. Kučera ; W. Poirier ; B. Jeanneret ; A.F. Satrapinski ; A.Y. Tzalenchuk ; P. Vrabček ; T. Bergsten ; C. Hwang ; R.T. Yakimova ; Sergey Kubatkin (Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik)
CPEM Digest. 29th Conference on Precision Electromagnetic Measurements, CPEM 2014; Rio de Janeiro; Brazil; 24 August 2014 through 29 August 2014 (0589-1485). p. 548-549. (2014)
[Konferensbidrag, refereegranskat]

A new joint research project (JRP) integrating metrology institutes and universities from nine countries is aimed at realization of a new generation of standards for quantum resistance metrology. The project exploits graphene's properties to simplify operation of standards without compromising the unprecedented precision delivered by semiconductor quantum Hall devices. Higher operating temperatures (above 4.2 K, and up to 8 K) and together with lower magnetic fields (below 5 T, and potentially down to 2 T) will lead to a significantly improved and cost-saving dissemination of intrinsically referenced resistance standards to all end-users relying on electrical measurements.

Nyckelord: graphene , Measurement standards , quantum hall effect , resistance

Article number 6898502

Denna post skapades 2014-10-28.
CPL Pubid: 204961


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Institutioner (Chalmers)

Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik



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