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Effective Electron Microrefrigeration by SIN Tunnel Junctions with Advanced Geometry of Electrodes and Normal Metal Traps

Ian Agulo (Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik) ; Leonid Kuzmin (Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik) ; Michael Fominsky (Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik) ; Mikhail Tarasov (Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik)
Nanotechnology Vol. 15 (2004), p. S224-S228.
[Artikel, refereegranskad vetenskaplig]

We demonstrate effective electron cooling of the normal metal strip by superconductor-insulator-normal metal (SIN) tunnel junctions. The improvement was achieved by two methods: first by using an advanced geometry of the superconducting electrodes for more effective removal of the quasiparticles; and second, by adding a normal metal trap just near the cooling junctions. With simple cross geometry and without normal metal traps, the decrease in electron temperature is 56 mK. With the advanced geometry of the superconducting electrodes, the decrease in electron temperature is 129 mK. With the addition of the normal metal traps, the decrease in electron temperature is 197 mK.

Nyckelord: SIN tunnel junctions, electron refrigeration, normal metal traps



Denna post skapades 2006-08-29. Senast ändrad 2015-12-17.
CPL Pubid: 2029

 

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