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Microwave losses in MgO, LaAlO3, and (La0.3Sr0.7)(Al0.65Ta0.35)O-3 dielectrics at low power and in the millikelvin temperature range

Marco Arzeo (Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik) ; Floriana Lombardi (Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik) ; Thilo Bauch (Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik)
Applied Physics Letters (0003-6951). Vol. 104 (2014), 21,
[Artikel, refereegranskad vetenskaplig]

We have investigated both the temperature and the power dependence of microwave losses for various dielectrics commonly used as substrates for the growth of high critical temperature superconductor thin films. We present measurement of niobium superconducting lambda/2 coplanar waveguide resonators, fabricated on MgO, LaAlO3, and (La0.3Sr0.7)(Al0.65Ta0.35)O-3 (LSAT), at the millikelvin temperature range and at low input power. By comparing our results with the two-level system model, we have discriminated among different dominant loss mechanisms. LSAT has shown the best results as regards the dielectric losses in the investigated regimes.

Article Number: 212601

Denna post skapades 2014-07-10. Senast ändrad 2014-08-21.
CPL Pubid: 200393


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Institutioner (Chalmers)

Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik



Chalmers infrastruktur