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Application of the characteristic basis function pattern method to reflector surface inaccuracies and sidelobe modeling

A. Young ; Rob Maaskant (Institutionen för signaler och system, Antenner) ; Marianna Ivashina (Institutionen för signaler och system, Antenner) ; D.B. Davidson
Proceedings of the 2013 International Conference on Electromagnetics in Advanced Applications, ICEAA 2013 p. 555-558. (2013)
[Konferensbidrag, refereegranskat]

The Characteristic Basis Function Pattern Method (CBFPM) is applied to compensate for pattern variations that result from surface inaccuracies in a dual-reflector antenna system. Toward evaluating the efficiency of this pattern modeling technique in a realistic environment, the impact of noise in calibration measurements required to solve for the pattern model, as well as that of calibration measurements in non-ideal directions, are considered. © 2013 IEEE.

Denna post skapades 2013-12-16. Senast ändrad 2017-03-21.
CPL Pubid: 189282


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Institutioner (Chalmers)

Institutionen för signaler och system, Antenner (2005-2014)


Elektroteknik och elektronik

Chalmers infrastruktur