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PC2: Identifying noise processes in superconducting resonators

J. Burnett ; Tobias Lindström ; I. Wisby ; Sebastian Erik de Graaf (Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik) ; Astghik Adamyan (Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik) ; Andrey Danilov (Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik) ; Sergey Kubatkin (Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik) ; Philip J. Meeson ; Alexander Ya Tzalenchuk
2013 IEEE 14th InternationalSuperconductive Electronics Conference, ISEC 2013 p. Art. no. 6604284. (2013)
[Konferensbidrag, refereegranskat]

Extensive studies of dielectric loss due to two level fluctuators (TLFs) in superconducting resonators have provided routes for low loss resonators. The research is motivated not only by the use of resonators as detectors and in quantum information processing, but more generally due to TLFs being a source of noise and decoherence in all quantum devices. In this work a frequency locked loop was used to measure frequency fluctuations at timescales in excess of 104 seconds, thereby accurately probing the TLF induced low- frequency noise of the resonator. Our measurement method lead to very high statistical confidence even for very long timescales, and here we can therefore present results explicitly identifying power dependent flicker frequency noise (S = 1/fa where a=1) persisting down to the mHz level.

Nyckelord: 1/f noise, superconducting device, Two level fluctuators

Denna post skapades 2013-11-27. Senast ändrad 2016-07-04.
CPL Pubid: 187553


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Institutioner (Chalmers)

Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik



Chalmers infrastruktur