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Characterisation of bipolar transistors : parameter extraction and degradation dynamics

Fredrik Ingvarson (Institutionen för mikroelektronik)
Göteborg : Chalmers University of Technology, 1998. ISBN: 91-7197-722-8.- 35 s.
[Licentiatavhandling]

Nyckelord: parameter extraction, direct extraction, bipolar junction transistor, Gummel-Poon transistor model, early effect, series resistance extraction, current gain degradation, reverse-bias stress, stress dynamics, recovery dynamics



Denna post skapades 2013-11-14.
CPL Pubid: 186705

 

Institutioner (Chalmers)

Institutionen för mikroelektronik (1995-2003)

Ämnesområden

Elektronik

Chalmers infrastruktur

Ingår i serie

Technical report L - School of Electrical and Computer Engineering, Chalmers University of Technology. 294