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Magnetic Scanning Probe Calibration Using Graphene Hall Sensor

V. Panchal ; O. Iglesias-Freire ; Arseniy Lartsev (Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik) ; R. Yakimova ; A. Asenjo ; O. Kazakova
Ieee Transactions on Magnetics (0018-9464). Vol. 49 (2013), 7, p. 3520-3523.
[Artikel, refereegranskad vetenskaplig]

Magnetic force microscopy (MFM) offers a unique insight into the nanoscopic scale domain structures of magnetic materials. However, MFM is generally regarded as a qualitative technique and, therefore, requires meticulous calibration of the magnetic scanning probe stray field (B-probe) for quantitative measurements. We present a straightforward calibration of B-probe using scanning gate microscopy on epitaxial graphene Hall sensor in conjunction with Kelvin probe force microscopy feedback loop to eliminate sample-probe parasitic electric field interactions. Using this technique, we determined B-probe similar to 70 mT and similar to 76 mT for probes with nominal magnetic moment similar to 1 x 10(-13) and > 3 x 10(-13) emu, respectively, at a probe-sample distance of 20 nm.

Nyckelord: Epitaxial graphene, Hall sensor, Kelvin probe force microscopy (KPFM), magnetic probe calibration

Denna post skapades 2013-09-10.
CPL Pubid: 183020


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Institutioner (Chalmers)

Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik


Teknisk fysik

Chalmers infrastruktur