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Optical response of a titanium-based cold-electron bolometer

Ernst Otto (Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik) ; Mikhail Tarasov (Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik) ; P. K. Grimes ; Artem Chekushkin (Institutionen för mikroteknologi och nanovetenskap) ; Leonid Kuzmin (Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik) ; G. Yassin
Superconductor Science & Technology (0953-2048). Vol. 26 (2013), 8,
[Artikel, refereegranskad vetenskaplig]

We present experimental results on the testing of cold-electron bolometer (CEB) detectors comprised of a thin Ti film absorber and two SIN junctions integrated with a planar antenna. The CEB performance was tested in a He-3 sorption cryostat HELIOX-AC-V at bath temperatures of 280-305 mK. The optical response was measured using the hot/cold load method by flipping a Cu reflector opposite a blackbody surface inside a 3 K shield and using a thermal source with variable temperature. In the first experiment, the detector chip was mounted in an optical sample-holder whose aperture was switched towards or away from a blackbody source changing the incident radiation temperature from 3 K to 270 mK. As a result, we measured the optical response to a 3 K/270 mK radiation temperature change. The measured voltage response value for the detector integrated in a double-dipole antenna was Delta V-out = 120 mu V. This corresponds to a noise equivalent power of NEP = V-n/(dV/dP) = 3.5 x 10(-17) W Hz(-1/2), where dV/dP is the voltage to power response obtained from the incoming power estimation based on the Planck formula.

Denna post skapades 2013-08-15. Senast ändrad 2016-10-26.
CPL Pubid: 181459


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