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Microstructural characterisation of fretting damage

Ros-Marie Lundh (Fysiska institutionen)
Göteborg : Chalmers University of Technology, 1994. ISBN: 991-884869-3.- iii s., s. 4-132 : s.
[Licentiatavhandling]

Nyckelord: fretting, fretting fatigue, fretting corrosion, fretting wear, debris, fretting microstructure, fretting mechanisms, wear mechanisms, SEM, TEM, AFM, STM



Denna post skapades 2013-08-13.
CPL Pubid: 181234

 

Institutioner (Chalmers)

Fysiska institutionen (1964-2000)

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Fysik

Chalmers infrastruktur