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Combining Scanning Probe Microscopy and Transmission Electron Microscopy

Alexandra Nafari (Institutionen för mikroteknologi och nanovetenskap, Bionanosystem) ; Johan Angenete ; Krister Svensson ; Anke Sanz-Velasco (Institutionen för mikroteknologi och nanovetenskap, Bionanosystem) ; Håkan Olin
Scanning Probe Microscopy in Nanoscience and Nanotechnology p. 59-134. (2011)
[Kapitel]

This chapter is a review of an in situ method where a scanning electron microscope (SPM) has been combined with a transmission electron microscope (TEM). By inserting a miniaturized SPM inside a TEM, a large set of open problems can be addressed and, perhaps more importantly, one may start to think about experiments in a new kind of laboratory, an in situ TEM probing laboratory, where the TEM is transformed from a microscope for still images to a real-time local probing tool. In this method, called TEMSPM, the TEM is used for imaging and analysis of a sample and SPM tip, while the SPM is used for probing of electrical and mechanical properties or for local manipulation of the sample. This chapter covers both instrumental and application aspects of TEMSPM.

Nyckelord: SPM, TEM, TEMSPM



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Denna post skapades 2013-01-09.
CPL Pubid: 169839

 

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Institutioner (Chalmers)

Institutionen för mikroteknologi och nanovetenskap, Bionanosystem (2007-2015)

Ämnesområden

Materialvetenskap
Nanovetenskap och nanoteknik
Annan elektroteknik och elektronik
Materialteknik
Nanoteknik

Chalmers infrastruktur