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Thermal performance characterization of nano thermal interface materials after power cycling

S. Sun ; L. Xin ; Carl Zandén (Institutionen för mikroteknologi och nanovetenskap, Bionanosystem) ; Björn Carlberg (Institutionen för mikroteknologi och nanovetenskap, Bionanosystem) ; L. Ye ; Johan Liu (Institutionen för mikroteknologi och nanovetenskap, Bionanosystem)
Proceedings - Electronic Components and Technology Conference (0569-5503). p. 1426-1430. (2012)
[Konferensbidrag, refereegranskat]

The need for faster, smaller, and more reliable and efficient products has resulted in increase of heat generated in microelectronic components. The removal of the heat generated is an important issue in electronic packaging. A novel Nano-TIM was developed to improve the heat dissipation of electronics packaging. This paper aims at studying the heat dissipation performance of a new class of nano-structured polymer-metal composite film (Nano-TIM) after power cycling. The new Nano-TIM uses metal to provide continuous thermal pathways while using nano-polymer to control the elasticity of the TIM. Through semiconductor processing and RTD principle, chips including 5*5, 10*10, 20*20, 30*30 (mm 2), were developed to study different size's influence on heat dissipation effect of the Nano-TIM. Additional parameters studied include power effect. RTD is used respectively to measure the junction temperature, and then the R thJC (Junction-to-Case Thermal Resistance) is calculated afterwards. The Transient thermal resistances of the Nano-TIM were also tested by T3Ster method to further study heat dissipation effect of Nano-TIM. The morphologies and interaction between the Nano-TIM and chips were carefully studied using X-ray Scanning Microscope to analyze heat flow path. The result shows that Nano-TIMs can be used to 30 mm in chip length as the thermal interface material.

Nyckelord: Different sizes, Dissipation effects, Electronic Packaging, Heat flow path, In-chip, Junction temperatures, Microelectronic components, Nano-structured, Polymer-metal composite, Power cycling, Power effects, Semiconductor processing, Thermal interface materials, Thermal Performance, Transient thermal resistance, X ray scanning

2012 IEEE 62nd Electronic Components and Technology Conference, ECTC 2012;San Diego, CA;29 May 2012through1 June 2012

Denna post skapades 2012-10-23.
CPL Pubid: 165027


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Institutioner (Chalmers)

Institutionen för mikroteknologi och nanovetenskap, Bionanosystem (2007-2015)


Elektroteknik och elektronik

Chalmers infrastruktur