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Time-resolved error vector magnitude for transmitter mask testing in coherent optical transmission systems

H. Sunnerud ; M. Westlund ; M. Sköld ; Peter Andrekson (Institutionen för mikroteknologi och nanovetenskap, Fotonik)
2011 Optical Fiber Communication Conference and Exposition and the National Fiber Optic Engineers Conference, OFC/NFOEC 2011 (21622701). p. 223-225. (2011)
[Konferensbidrag, refereegranskat]

We propose a novel transition-sensitive measurement approach for coherent optical systems. The time-resolved error vector magnitude (EVM), combined with mask testing, is a powerful tool for pass/fail testing of transmitters in coherent systems.



Denna post skapades 2011-08-25. Senast ändrad 2015-05-04.
CPL Pubid: 144911

 

Institutioner (Chalmers)

Institutionen för mikroteknologi och nanovetenskap, Fotonik

Ämnesområden

Fotonik

Chalmers infrastruktur