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Electron backscattering diffraction and X-ray diffraction studies of interface relationships in Sr3Ru2O7/Sr2RuO4 eutectic crystals

R. Ciancio (Institutionen för teknisk fysik, Mikroskopi och mikroanalys) ; Henrik Pettersson (Institutionen för teknisk fysik, Mikroskopi och mikroanalys) ; R. Fittipaldi ; Alexei Kalaboukhov (Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik) ; P. Orgiani ; A. Vecchione ; Y. Maeno ; S. Pace ; Eva Olsson (Institutionen för teknisk fysik, Mikroskopi och mikroanalys)
Micron (0968-4328). Vol. 42 (2011), 4, p. 324-329.
[Artikel, refereegranskad vetenskaplig]

Sr3Ru2O7/Sr2RuO4 eutectic system is investigated by electron backscattering diffraction (EBSD) and X-ray diffraction (XRD). The eutectic growth enables the solidification of the two phases in an ordered lamellar pattern extending along the growth direction, namely the b-axis direction. The eutectic material thus provides in the a-c plane two distinct interfaces having different microstructures with respect to the growth direction. Our analysis shows that, across the inplane c-axis direction (characterized by a poor lattice matching), the b-axis orientation is not constant at the individual interfaces, showing an orientation spread of about 5 degrees. However, across the in-plane a-axis direction (characterized by a good lattice matching), the b-axis orientation does not change within a few tenths of degree (about 0.25 degrees). Such information at nanoscale is also verified on a macroscopic level by standard XRD investigation.

Nyckelord: EBSD, FEG-SEM, X-ray diffraction, Eutectic structure, itinerant ferromagnet srruo3, transport-properties, sr1-xcaxruo3, growth, bulk



Denna post skapades 2011-04-21. Senast ändrad 2017-09-14.
CPL Pubid: 139671

 

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Institutioner (Chalmers)

Institutionen för teknisk fysik, Mikroskopi och mikroanalys (2005-2012)
Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik

Ämnesområden

Fysik

Chalmers infrastruktur