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Full characterization of a high-power semiconductor disk laser beam with simultaneous capture of optimally sized focus and farfield

Carl Borgentun (Institutionen för mikroteknologi och nanovetenskap, Fotonik) ; Jörgen Bengtsson (Institutionen för mikroteknologi och nanovetenskap, Fotonik) ; Anders Larsson (Institutionen för mikroteknologi och nanovetenskap, Fotonik)
Applied Optics (1559-128X). Vol. 50 (2011), 12, p. 1640-1649.
[Artikel, refereegranskad vetenskaplig]

We report on a beam characterization method that is based on the simultaneous measurement of the focus field and the farfield, thus avoiding problems with beam fluctuations during the measurement. By using reflections from both sides of a planoconvex lens, the method implements two branches of an optical system working simultaneously. Also, by letting the planoconvex lens be antireflection treated, and by allowing for both of the reflected fields to fill large and approximately equal areas on a camera detector array, the method significantly lowers the intensity onto the detector array, thus minimizing the need for additional disturbing attenuation filters to avoid camera saturation. In the numerical retrieval of the phase distribution, based on the measured intensity distributions of the focus and farfield, iterative propagation between the two branches is performed. The phase retrieval uses the two-step algorithm for the numerical field propagation conveniently providing an arbitrary choice of sampling distance in each plane.

Nyckelord: Phase retrieval, Semiconductor lasers, Laser beam characterization

This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website:
Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.

Denna post skapades 2011-04-18. Senast ändrad 2016-04-11.
CPL Pubid: 139211


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