CPL - Chalmers Publication Library
| Utbildning | Forskning | Styrkeområden | Om Chalmers | In English In English Ej inloggad.

Reynolds Stress Measurements using Direction-Sensitive Double-Chip Silicon Sensors

Lennart Löfdahl (Institutionen för termo- och fluiddynamik) ; Göran Stemme (Institutionen för tillämpad elektronik) ; Bert Johansson (Institutionen för termo- och fluiddynamik)
Measurements Science and Technology Vol. 2 (1991), p. 369-373.
[Artikel, refereegranskad vetenskaplig]

A small direction-sensitive double-chip silicon-based sensor has been designed and fabricated using microelectronic technology. To determine the performance of this sensor the Reynolds stresses in a two-dimensional flat plate boundary layer were determined at a Reynolds number of 4.2*106. Comparisons with conventional hot-wire sensors were made showing that the double-chip sensor was able to determine the turbulent stresses to the same accuracy as a cross hot wire.

Denna post skapades 2010-08-23. Senast ändrad 2010-08-30.
CPL Pubid: 125050


Institutioner (Chalmers)

Institutionen för termo- och fluiddynamik (1989-2004)
Institutionen för tillämpad elektronik (1900-2003)



Chalmers infrastruktur