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Oxidation behavior of a Mo (Si, Al)(2)-based composite at 300-1000 degrees C

Linda Ingemarsson (Institutionen för kemi- och bioteknik, Oorganisk miljökemi) ; Mats Halvarsson (Institutionen för teknisk fysik, Mikroskopi och mikroanalys) ; J. Engkvist ; Torbjörn Jonsson (Institutionen för teknisk fysik, Mikroskopi och mikroanalys) ; K. Hellstrom ; Lars-Gunnar Johansson (Institutionen för kemi- och bioteknik, Oorganisk miljökemi) ; Jan-Erik Svensson (Institutionen för kemi- och bioteknik, Oorganisk miljökemi)
Intermetallics (0966-9795). Vol. 18 (2010), 4, p. 633-640.
[Artikel, refereegranskad vetenskaplig]

The oxidation behavior of a Mo (Si,Al)(2)-based composite of Mo(Si,Al)(2), Al2O3 and Mo-5(Si,Al)(3) (Kanthal Super ER) in synthetic air was investigated. The samples were oxidized isothermally for up to 72 h at 300-1000 degrees C using a thermobalance. The microstructure was analyzed by X-ray diffraction (XRD), Scanning Electron Microscopy (SEM) and Auger Electron Spectroscopy (AES) depth profiling. Broad ion beam milling (BIB) was used to prepare cross-sections. Oxidation behavior depended strongly on the composition of the substrate which consisted of a Mo(Si,Al)(2) matrix and the minority phases Mo-5(Si,Al)(3) and Al2O3. At 300-500 degrees C the mass gains were small with parabolic kinetics, oxidation resulting in a mixture of oxides that reflects the substrate composition. At 600 and 700 degrees C the oxide scale is thin and protective and depleted in molybdenum, a mass loss occurring due to MoO3 vaporization. At 1000 degrees C a protective alpha-alumina scale forms.

Nyckelord: Molybdenum silicides, Multiphase intermetallics, Oxidation, Spectroscopic methods, various, Electron microscopy, scanning, HIGH-TEMPERATURE OXIDATION, MOSI2-BASED COMPOSITE, 773 K, MOSI2, AL, SILICIDES, RESISTANCE, ALLOYS, RANGE, FILMS

Denna post skapades 2010-05-05. Senast ändrad 2017-10-03.
CPL Pubid: 121242


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Institutioner (Chalmers)

Institutionen för kemi- och bioteknik, Oorganisk miljökemi (2005-2014)
Institutionen för teknisk fysik, Mikroskopi och mikroanalys (2005-2012)



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