CPL - Chalmers Publication Library
| Utbildning | Forskning | Styrkeområden | Om Chalmers | In English In English Ej inloggad.

Electrodeless QCM-D for lipid bilayer applications

Angelika Kunze (Institutionen för teknisk fysik, Biologisk fysik) ; Michael Zäch (Institutionen för teknisk fysik, Kemisk fysik) ; Sofia Svedhem (Institutionen för teknisk fysik, Biologisk fysik) ; Bengt Kasemo (Institutionen för teknisk fysik, Kemisk fysik)
Biosensors and Bioelectronics (0956-5663). Vol. 26 (2011), 5, p. 1833-1838.
[Artikel, refereegranskad vetenskaplig]

An electrodeless quartz crystal microbalance with dissipation monitoring (QCM-D) setup is used to monitor the formation of supported lipid bilayers (SLBs) on bare quartz crystal sensor surfaces. The kinetic behavior of the formation of a 1-palmitoyl-2-oleoyl-sn-glycero-3-Phosphocholine (POPC) SLB on SiO2 surfaces is discussed and compared for three cases: (i) a standard SiO2 film deposited onto the gold electrode of a quartz crystal, (ii) an electrodeless quartz crystal with a sputter-coated SiO2 film, and (iii) an uncoated electrodeless quartz crystal sensor surface. We demonstrate, supported by imaging the SLB on an uncoated electrodeless surface using atomic force microscopy (AFM), that a defect-free, completely covering bilayer is formed in all three cases. Differences in the kinetics of the SLB formation on the different sensor surfaces are attributed to differences in surface roughness. The latter assumption is supported by imaging the different surfaces using AFM. We show furthermore that electrodeless quartz crystal sensors can be used not only for the formation of neutral SLBs but also for positively and negatively charged SLBs. Based on our results we propose electrodeless QCM-D to be a valuable technique for lipid bilayer and related applications providing several advantages compared to electrode-coated surfaces like optical transparency, longer lifetime, and reduced costs.

Nyckelord: Electrodeless quartz crystal microbalance, supported lipid bilayer, atomic force microscopy, SiO2, surface roughness

Den här publikationen ingår i följande styrkeområden:

Läs mer om Chalmers styrkeområden  

Denna post skapades 2010-01-25. Senast ändrad 2011-10-30.
CPL Pubid: 110842


Läs direkt!

Länk till annan sajt (kan kräva inloggning)

Institutioner (Chalmers)

Institutionen för teknisk fysik, Biologisk fysik (2007-2015)
Institutionen för teknisk fysik, Kemisk fysik (1900-2015)


Nanovetenskap och nanoteknik
Kemisk fysik

Chalmers infrastruktur