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Improvement of chip design to reduce resonances in subgap regime of Josephson junctions

Tine Greibe (Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik) ; Thilo Bauch (Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik) ; Christopher Wilson (Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik) ; Per Delsing (Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik)
Journal of Physics: Conference Series. 25th International Conference on Low Temperature Physics (LT25) Leiden Inst Phys, Kamerlingh Onnes Lab, Amsterdam, NETHERLANDS, AUG 06-13, 2008 (1742-6588 ). Vol. 150 (2009), p. 052063.
[Konferensbidrag, refereegranskat]

Excess current peaks in the IV curves of SIS Josephson junctions have been observed by some groups [1–3]. These peaks have the shape of a resonance as a function of voltage. The resonances appear in the subgap regime of the junctions and the subgap current (leakage current) is concealed. The positions of the resonances do not change as a magnetic field is applied to the junctions, but their amplitude decreases when the supercurrent is suppressed. We have measured the subgap current of Al/AlOx/Al junctions and we show that these resonances are due to resonant modes in the chip design which are excited by the ac-Josephson effect. We present a chip design that decreases the amplitude of the resonances to a such degree that the subgap current is quantifiable.

Nyckelord: Josephson junctions, onchip resonances, superconductivity



Denna post skapades 2010-01-17. Senast ändrad 2011-05-25.
CPL Pubid: 108193

 

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Institutioner (Chalmers)

Institutionen för mikroteknologi och nanovetenskap, Kvantkomponentfysik

Ämnesområden

Supraledning
Lågtemperaturfysik

Chalmers infrastruktur