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Accounting for the Skin Effect during Repeater Insertion

Daniel Andersson (Institutionen för data- och informationsteknik, Datorteknik (Chalmers)) ; Lars Svensson (Institutionen för data- och informationsteknik, Datorteknik (Chalmers)) ; Per Larsson-Edefors (Institutionen för data- och informationsteknik, Datorteknik (Chalmers))
2005 ACM Great Lakessymposium on VLSI, GLSVLSI'05; Chicago, IL; United States; 17 April 2005 through 19 April 2005 p. 32-37. (2005)
[Konferensbidrag, refereegranskat]

Since the skin effect will increase the propagation delay in an interconnect, it will also affect how to optimally select the number and size of the buffers. Failing to include the skin effect during buffer design may result in as much as 35% extra delay compared to the optimal repeater chain. We present a new method with closed-form expressions for repeater insertion where we take into account the skin effect and also the relationship between interconnect resistance, capacitance and inductance that are determined from the geometrical parameters. We also investigate the skin-effect influence on power dissipation for an optimally designed repeater chain, and find that the increase is at most 10% of the dynamic power dissipation.

Denna post skapades 2006-01-19. Senast ändrad 2016-09-14.
CPL Pubid: 10137


Institutioner (Chalmers)

Institutionen för data- och informationsteknik, Datorteknik (Chalmers)



Chalmers infrastruktur